CPCI-S(《科学会议录引文索引 》)
2015年我校收录情况。
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1. Vial Bottle Mouth Defect Detection Based on Machine Vision
Yang, ZF; Bai, JY
2015 IEEE INTERNATIONAL CONFERENCE ON INFORMATION AND AUTOMATION,2015,():2638-2642
证明编号:NBT-CPCIS-2015-431
2. Android Bluetooth Multi-Source Signal Acquisition For Multi-Parameter Health Monitoring Devices
Tang, XJ; Hu, C; Lin, WX
2015 IEEE INTERNATIONAL CONFERENCE ON INFORMATION AND AUTOMATION,2015,():1790-1794
证明编号:NBT-CPCIS-2015-430
3. Recognition algorithm of landmark for quadrotors aircraft based on image feature of corner points
Luo, KZ; Miao, HZ; Wang, L
2015 IEEE INTERNATIONAL CONFERENCE ON INFORMATION AND AUTOMATION,2015,():1437-1440
证明编号:NBT-CPCIS-2015-429
4. Magnetic Dipole Model in the Near-field
Ren, YP; Hu, C; Xiang, S; Feng, ZQ
2015 IEEE INTERNATIONAL CONFERENCE ON INFORMATION AND AUTOMATION,2015,():1085-1089
证明编号:NBT-CPCIS-2015-428
5. Investigation for Movement of Spiral-type Capsule Endoscope in the Porcine Large Intestine
Yang, WA; He, Y; Wu, ZX; Hu, C; Zou, YX; Qin, FQ
2015 IEEE INTERNATIONAL CONFERENCE ON INFORMATION AND AUTOMATION,2015,():563-566
证明编号:NBT-CPCIS-2015-427
6. An Efficient Magnetic Localization System For Indoor Planar Mobile Robot
Hu, C; Feng, ZQ; Ren, YP; Chen, YY; Lin, HX; Wang, K; Xu, XD; Bao, JM
2015 34TH CHINESE CONTROL CONFERENCE (CCC),2015,():4899-4904
证明编号:NBT-CPCIS-2015-424
7. PMSM Hamiltonian Energy Shaping Control with Parameters Self-tuning PID Control
Jun, Q; Chao, H; Sainv, Y
2015 34TH CHINESE CONTROL CONFERENCE (CCC),2015,():4506-4511
证明编号:NBT-CPCIS-2015-423
8. Analysis and solution of single phase winding broken fault of BLDCM
Zhang, Q; Qu, WT
2015 34TH CHINESE CONTROL CONFERENCE (CCC),2015,():4490-4494
证明编号:NBT-CPCIS-2015-422
9. Decoupling ARX Time-space model based GPC for distributed parameter system
Liu, PF; Tao, JL; Wang, XG
2015 34TH CHINESE CONTROL CONFERENCE (CCC),2015,():612-617
证明编号:NBT-CPCIS-2015-421
10. A Distinctive O(mn) Time Algorithm for Optimal Buffer Insertions
Wang, XS; Liu, WP; Yu, MY
PROCEEDINGS OF THE SIXTEENTH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED 2015),2015,():293-297
证明编号:NBT-CPCIS-2015-419
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