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扫描透射电子显微镜在材料科学中的应用Scanning Transmission Electron Microscopy: Applications in Materials Science |
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| 课程网址: | http://videolectures.net/kolokviji_ceh_microscopy/ |
| 主讲教师: | Miran Čeh |
| 开课单位: | 约瑟夫·斯特凡学院 |
| 开课时间: | 2013-12-18 |
| 课程语种: | 英语 |
| 中文简介: |  各种扫描透射电子显微镜（STEM）成像技术（ADF，HAADF，ABF）对于纳米级和原子级的材料表征已变得极为有用，特别是由于最近在矫正晶体球面像差（Cs）方面的发展。 （S）TEM的显微镜镜头。支持这些成像技术的主要原理是，检测器的设计应使其大部分收集高角度散射电子，从而最大程度地减少弹性散射电子对图像的贡献。结果，原子柱的强度可以与化学组成相关，或者在环形明场STEM成像的情况下，可以观察到光元素。本讲座将概述STEM成像技术的基本原理。将介绍和评论各种氧化物陶瓷材料在纳米和原子级上定性和定量STEM成像的结果。还将显示探针Cs校正（S）TEM的选定结果。 |
| 课程简介: | Various Scanning Transmission Electron Microscopy (STEM) imaging techniques (ADF, HAADF, ABF) have become extremely useful for materials characterization at the nano- and atomic scale, particularly due to recent developments in the correction of spherical aberrations (Cs) of the (S)TEM¢s microscope lenses. The main principle underpinning these imaging techniques is that the detectors are designed such that they mostly collect high-angle scattered electrons, thus minimizing the contribution of elastically scattered electrons to the image. As a consequence, the intensity of the atom columns can be correlated to the chemical composition, or in case of annular bright-field STEM imaging, the light elements can be observed. This lecture will present an overview on the basic principles of STEM imaging techniques. The results of qualitative and quantitative STEM imaging at the nano- and atomic scale will be presented and commented on for various oxide ceramic materials. Selected results from probe Cs-corrected (S)TEM will also be presented. |
| 关 键 词: | 扫描透射电子显微镜成像技术; 矫正晶体球面像差; 陶瓷材料 |
| 课程来源: | 视频讲座网 |
| 数据采集: | 2021-02-16：nkq |
| 最后编审: | 2021-04-09：yumf |
| 阅读次数: | 92 |