一种有效的混合半经典/量子力学模型模拟平面和线纳米晶体管An efficient, mixed semiclassical/quantum mechanical model to simulate planar and wire nano-transistors |
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课程网址: | http://videolectures.net/slonano07_selmi_ems/ |
主讲教师: | Luca Selmi |
开课单位: | 乌迪内大学 |
开课时间: | 2008-01-18 |
课程语种: | 英语 |
中文简介: | 用于与CMOS兼容的纳米电子器件的小型化平面和纳米线场效应器件的设计在纳米结构建模领域提出了新的挑战。需要评估包含不同通道材料(Si、Ge、应变Si、III-V)和晶体取向的创新装置的优缺点。体厚(tsi)和沟道长度(l)为几纳米的晶体管已被证明[UCH02,wak03],其中垂直(y)方向的强量化效应与准弹道共存,远离横向(x)方向的平衡载流子输运。在工程应用领域,迄今为止,真实纳米晶体管的全量子力学建模主要局限于弹道输运[LAU04]。然而,通道中的散射对于预测漏电流仍然非常重要,即使对于L≈10纳米器件也是如此[pal04]。此外,还不清楚散射的复杂全量子处理是否会导致可管理的数值模型,以及预期的巨大计算时间是否会通过提高精度得到满足。在这一贡献中,我们报告了一个有效的建模框架的最新进展,该框架能够将量子力学模拟的精度与载波传输的半经典处理相结合,旨在精确计算用于纳米电子应用的平面(和线状)器件的主要性能指标。离子。 |
课程简介: | The design of miniaturized planar and nanowire field effect devices for CMOS-compatible nano-electronics poses new challenges in the field of nanostructure modelling. Pros and cons of innovative devices incorporating different channel materials (Si, Ge, strained-Si, III-V) and crystal orientations need to be assessed. Transistors with body thickness (TSi) and channel length (L) of few nanometres have been demonstrated [Uch02,Wak03], where strong quantization effects in the vertical (y) direction coexist with quasi-ballistic, far from equilibrium carrier transport in the lateral (x) direction. In the field of engineering applications, full quantum–mechanical modelling of realistic nano-transistors has been so far mainly restricted to ballistic transport [Lau04]. However, scattering in the channel is still remarkably important to predict the drain current, even for nano-devices with L ≈10 nm [Pal04]. Moreover, it is unclear if the complex full quantum treatment of the scattering would lead to manageable numerical models, and if the expected huge computation times will be paid off by improved accuracy. In this contribution, we report recent advances in the development of an efficient modelling framework capable to combine the accuracy of quantum mechanical simulations with a semiclassical treatment of carrier transport aimed at the accurate calculation of the main performance metrics of planar (and wire-like) devices for nano-electronic applications. |
关 键 词: | 纳米技术 ; 量子力学; 晶体管 |
课程来源: | 视频讲座网 |
最后编审: | 2020-06-08:heyf |
阅读次数: | 36 |