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纳米粒子的分析电子显微镜

Analytical electron microscopy of nanoparticles
课程网址: http://videolectures.net/slonano07_drazic_aem/  
主讲教师: Goran Dražić
开课单位: 约瑟夫·斯特凡学院
开课时间: 2008-02-12
课程语种: 英语
中文简介:
分析电子显微镜(AEM)是用于纳米结构材料的微观结构研究的重要工具。专用的FEG仪器可使用多种方法研究纳米级体积,例如高分辨率透射电子显微镜(HRTEM),高分辨Z对比(STEM / HAADF)成像,不同的电子衍射技术(SAED,CBED,纳米衍射),X射线能量色散光谱(XEDS)和电子能量损失光谱(EELS)。在这项工作中,主要的重点将是对粒子的AEM研究,确定其尺寸,形态,化学和结构组成,取向等。研究从非晶相形成纳米级粒子的成核和结晶,分析小体积的轻元素在复杂的几何形状,单晶中次要元素的原子簇的确定,非晶基质中量子点的自组装研究等方面,将在工作中进行介绍和评论。在许多情况下,结晶度的测定是相当复杂和模棱两可的。某些材料中非晶相和晶相之间的边界非常宽且被涂抹。在通常情况下,可以使用经典方法(明场,暗场实验,选定区域电子)确定纳米粒子(团簇,胚胎,核,沉淀物,纳米线,纳米棒等)的数量,微晶尺寸和形状以及晶体结构的缺陷。衍射,高分辨率TEM)。在特定情况下,应使用一些新颖的方法从样本中提取有用的信息。此类方法是在确定纳米团簇的存在时使用纳米区域的化学成分波动,比较粒径和结晶度确定的计算和实验电子衍射图以及使用非标准几何形状进行吸收校正X射线能量色散光谱法测定颗粒化学成分的步骤。
课程简介: Analytical Electron Microscopy (AEM) is an essential tool for microstructural investigations of nanostructured materials. Dedicated FEG instruments enable study of nanosized volumes using various methods, such as high resolution transmission electron microscopy (HRTEM), hig-resolution Z-contrast (STEM/HAADF) imaging, different techniques of electron diffraction (SAED, CBED, nanodiffraction), X-ray energy dispersive spectroscopy (XEDS) and electron energy loss spectroscopy (EELS). In the work the main stress will be on AEM study of particles, determination of their size, morphology, chemical and structural composition, orientation, etc. Study of the nucleation and crystallization of nanosized particles from amorphous phase, analysis of light elements in small volumes with complicated geometries, determination of atomic clusters of secondary element in monocrystals, investigation of self-assembly of quantum dots in an amorphous matrix are examples that will be presented and commented in the work. Determination of the crystallinity is in many cases quite complicated and ambiguous. The boundary between amorphous and crystalline phase in certain materials is very broad and smeared. Amount, crystallite size and shape and defectiveness of the crystal structure of nanoparticles (clusters, embryos, nuclei, precipitates, nanowires, nanorods, etc.) could be in usual cases determined using classical approaches (bright-field, dark-field experiments, selected area electron diffraction, high-resolution TEM). In specific cases some novel approaches should be used to extract the useful information from the sample. Such approaches are the use of chemical composition fluctuations of nano-regions in the determination of the presence of nanoclusters, the comparison of calculated and experimental electron diffraction pattern in the particle size and the degree of crystallinity determination and the use of non-standard geometries for absorption correction procedures during the chemical composition determination of particle using X-ray energy dispersive spectroscopy.
关 键 词: 电子显微镜; 纳米结构; 颗粒化学
课程来源: 视频讲座网
最后编审: 2019-09-21:cwx
阅读次数: 59